{"id":866,"date":"2022-07-19T20:31:22","date_gmt":"2022-07-19T20:31:22","guid":{"rendered":"https:\/\/demec.ufpr.br\/gbio\/?post_type=publicacoes-cpt&#038;p=866"},"modified":"2024-09-08T23:11:20","modified_gmt":"2024-09-08T23:11:20","slug":"marino-c-e-b-biaggio-s-r-rocha-filho-r-c-bocchi-n-nascente-p-a-p","status":"publish","type":"publicacoes-cpt","link":"https:\/\/demec.ufpr.br\/gbio\/publicacoes-cpt\/marino-c-e-b-biaggio-s-r-rocha-filho-r-c-bocchi-n-nascente-p-a-p\/","title":{"rendered":"MARINO, C. E. B.;\u00a0BIAGGIO, S. R.\u00a0;\u00a0ROCHA FILHO, R. C.\u00a0;\u00a0BOCCHI, N.\u00a0;\u00a0NASCENTE, P. A. P."},"content":{"rendered":"\n<p class=\"wp-block-paragraph\">XPS characterization of anodic titanium oxide films grown in phosphate buffer solutions. THIN SOLID FILMS, v. 468, p. 109-112, 2004.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Cita\u00e7\u00f5es: 91|96<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong><a href=\"http:\/\/dx.doi.org\/10.1016\/j.tsf.2004.05.006\">Acesse<\/a><\/strong><\/p>\n","protected":false},"featured_media":0,"template":"","class_list":["post-866","publicacoes-cpt","type-publicacoes-cpt","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/demec.ufpr.br\/gbio\/wp-json\/wp\/v2\/publicacoes-cpt\/866","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/demec.ufpr.br\/gbio\/wp-json\/wp\/v2\/publicacoes-cpt"}],"about":[{"href":"https:\/\/demec.ufpr.br\/gbio\/wp-json\/wp\/v2\/types\/publicacoes-cpt"}],"wp:attachment":[{"href":"https:\/\/demec.ufpr.br\/gbio\/wp-json\/wp\/v2\/media?parent=866"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}